PPT-311 Essential Rules of Thumb
In this presentation, I introduce the value of rules of thumb to help calibrate your engineering intuition. Never sign off on a design based on a rule of thumb. However, the starting place for every calculation should be a rule of thumb.
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PPT-310 Pathological Cross Talk Can Ruin Your Day at 28 Gbps
These are the slides from the talk I gave at the 2013 IMS workshop on Signal Integrity. The title is Pathological Crosstalk, How Cross Talk Can Ruin Your Day at 28 Gbps.
I review the limits to acceptable cross talk and then look at thre...read more. |
PPT-309 Handouts for the Hands on Workshop on S-Parameter Measur
This is a copy of the handouts and lab exercises distributed to students in the HOW-SPM class. These lessons all apply to using the SKIT board provided by CCN Labs. The instructi...read more. |
PPT-308 A Potpourri of Si Puzzles
These are the slides from my speed training event at DesignCon 2013 where I presented a selection of puzzles and myths related to signal integrity.
I covered three categories: the...read more. |
PPT-307 Getting Started with QUCS
This is the presentation I gave at the 2012 IEEE EMC Symposium as part of the Global EMC and SI University, where I was a co-dean.
If you are looking for a simple, easy to use SPICE-li...read more. |
PPT-306 Which is Better: Use One Value Capacitor or Three Differ
These are the slides to a presentation I give at IEEE EMC Society chapter meetings. The complete title is
“Which is Better: Use One Value Capacitor or Three Different Values for the PDN?…and why this is...read more. |
PPT-305 Why You Need EM for SI Applications
This is a copy of the slides for the presentation I first did for the IEEE chapter at the Univ. of Utah on May 8, 2012.
This talk is a spin off of the presentation I gav...read more. |
PPT-304 When Worlds Collide
These are the slides to the presentation I first gave at the IEEE IMS and MTT Society meetings in New Jersey on April 25, 2012.
I discuss why there is so much confusion between the wor...read more. |
PPT-303 Technology Trends
These are the slides from a brief presentation on some of the future trends I see in high speed serial links and the challenges ahead for the industry.read more. |
PPT-302 How Return Loss Gets its Ripples
With few exceptions, measured or simulated return loss of any interconnect shows ripples. What is it about the features of an interconnect, or about the properties of S-parameters that cause this pattern? What does it ...read more. |
PPT-300 DesignCon 2012 Practical PCB Figures of Merit
These are the slides from the presentation Don DeGroot and Alan Blankman and I did at DesignCon, "A Practical Approach for Using Circuit Board Qualification Test Results to Accurately Simulate High...read more. |
PPT-NMA-855 Reading S-Parameters Like a Book
These are the slides from the webinar we presented in Sept 2011, “How to read S-parameters like a book.” We show how much additional information is hidden inside S-parameters if you open lid...read more. |
BTS-325 Differential Channel Design Techniques to Open Eyes
This is a copy of the slides to one of most popular talks. We introduce the four chief signal integrity problems in high speed differential channels which contribute to collapse of the eye and increased bit error rate. By understanding their ro...read more. |
BTS-304 Forensic S-Parameter Analysis
This is the presentation I gave at the Penn State SI Symposium, April 11, 2011. I introduce the term "Forensic" S-parameter analysis to describe using S-parameter data to uncover the root cause of performance. This leverages ALL the S-parameter...read more. |
BTS-315 Bouncing Out ground Bounce to Reduce EMI
These are the handouts for a presentation I gave originally to the Boston chapter of the IEEE EMC Society on Sept 28, 2011 in Boston, MA.
I review the p...read more. |
BTS-324 Ground Bounce and EMI
These are the slides from the popular talk I do for the IEEE EMC Society on ground bounce and EMI. I review the root cause of ground bounce, what it is and how it is created and how it can lead to signal integrity and EMI problems. From the roo...read more. |
BTS-306 Measuring MilliOhms with a 50 Ohm VNA
In this talk, I show how a VNA can be used as an impedance analyzer and its limitations. For low impedances, 2-ports are required. I introduce how to analyze 2-port meaurements to measure very low impedances into very high frequency, a technque...read more. |
BTS-303_EthernetSummitConference
This is a copy of the paper I presented at the Ethernet Summit In Feb 22, 2011 on Data Mining S-parameters.read more. |
BTS-302_DesignCon2011_WhyFields
This is a copy of the presentation I gave with my colleagues at Intel on the limits to voltages, currents and circuit elements. We introduce four signal integrity effects for which electromagnetic fi...read more. |
BTS-301_DesignCon2011_S-parameter_panel
This is a copy of the presentation I gave on the S-parameter panel at DesignCon 2011. In this brief presentation, I introduce the 12 killer apps for S-parameter characterization.read more. |
