PPT-302 How Return Loss Gets its Ripples
With few exceptions, measured or simulated return loss of any interconnect shows ripples. What is it about the features of an interconnect, or about the properties of S-parameters that cause this pattern? What does it ...read more. |
PPT-300 DesignCon 2012 Practical PCB Figures of Merit
These are the slides from the presentation Don DeGroot and Alan Blankman and I did at DesignCon, "A Practical Approach for Using Circuit Board Qualification Test Results to Accurately Simulate High...read more. |
PPT-NMA-855 Reading S-Parameters Like a Book
These are the slides from the webinar we presented in Sept 2011, “How to read S-parameters like a book.” We show how much additional information is hidden inside S-parameters if you open lid...read more. |
BTS-325 Differential Channel Design Techniques to Open Eyes
This is a copy of the slides to one of most popular talks. We introduce the four chief signal integrity problems in high speed differential channels which contribute to collapse of the eye and increased bit error rate. By understanding their ro...read more. |
BTS-304 Forensic S-Parameter Analysis
This is the presentation I gave at the Penn State SI Symposium, April 11, 2011. I introduce the term "Forensic" S-parameter analysis to describe using S-parameter data to uncover the root cause of performance. This leverages ALL the S-parameter...read more. |
BTS-315 Bouncing Out ground Bounce to Reduce EMI
These are the handouts for a presentation I gave originally to the Boston chapter of the IEEE EMC Society on Sept 28, 2011 in Boston, MA.
I review the p...read more. |
BTS-306 Measuring MilliOhms with a 50 Ohm VNA
This is a copy of the talk I gave for the Japan Earthquake and Tsunami Relief webinar on April 20, 2011. I introduce the process to use 2-port meaurements to measure very low impedances into very high frequency, a technque critically important ...read more. |
BTS-303_EthernetSummitConference
This is a copy of the paper I presented at the Ethernet Summit In Feb 22, 2011 on Data Mining S-parameters.read more. |
BTS-302_DesignCon2011_WhyFields
This is a copy of the presentation I gave with my colleagues at Intel on the limits to voltages, currents and circuit elements. We introduce four signal integrity effects for which electromagnetic fi...read more. |
BTS-301_DesignCon2011_S-parameter_panel
This is a copy of the presentation I gave on the S-parameter panel at DesignCon 2011. In this brief presentation, I introduce the 12 killer apps for S-parameter characterization.read more. |
BTS-300_DesignCon2011_AFR_Calibration_Technique
This is a copy of the paper I presented at DesignCon 2011 with Mike Resso describing a new calibration technique using a 2x reference thru structure. This technique may ultimately replace the TRL and...read more. |
